Third-order intermodulation distortion in YBa2Cu3O7-δ grain boundaries

Hao Xin, D. E. Oates, G. Dresselhaus, M. S. Dresselhaus

Research output: Contribution to journalArticle

18 Scopus citations

Abstract

Results are presented on the microwave intermodulation distortion (IMD) measured in high-temperature-superconducting YBa2Cu3O7-δ engineered grain boundaries fabricated on bicrystal substrates. The two-tone IMD at 4.4 GHz of thin YBCO plain films without engineered grain boundaries and films with engineered bicrystal grain boundaries of misorientation-angles from 2° to 24° was measured as a function of microwave power and temperature in a suspended microstrip resonator configuration. The microwave power dependence of the IMD of the plain films and the films with grain boundaries is compared. The long Josephson-junction effects of high-angle grain boundaries were studied. The connection between the results for the microwave impedance of YBCO grain boundaries and for the IMD has been modeled. We find that for grain boundaries of less than 7.5°, the IMD is indistinguishable from that of the plain film.

Original languageEnglish (US)
Article number214533
Pages (from-to)2145331-2145335
Number of pages5
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume65
Issue number21
Publication statusPublished - Jun 1 2002
Externally publishedYes

    Fingerprint

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Xin, H., Oates, D. E., Dresselhaus, G., & Dresselhaus, M. S. (2002). Third-order intermodulation distortion in YBa2Cu3O7-δ grain boundaries. Physical Review B - Condensed Matter and Materials Physics, 65(21), 2145331-2145335. [214533].