Three-dimensional modeling of high-numerical-aperture imaging in thin films

Donis G. Flagello, Tom D. Milster

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Scopus citations

Abstract

This paper describes a modelling technique used to explore three dimensional (3D) image irradiance distributions formed by high numerical aperture (NA > 0.5) lenses in homogeneous, linear films. This work uses a 3D modelling approach that is based on a plane-wave decomposition in the exit pupil. Each plane wave component is weighted by factors due to polarization, aberration, and input amplitude and phase terms. This is combined with a modified thin-film matrix technique to derive the total field amplitude at each point in a film by a coherent vector sum over all plane waves. Then the total irradiance is calculated. The model is used to show how asymmetries present in the polarized image change with the influence of a thin film through varying degrees of focus.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherPubl by Int Soc for Optical Engineering
Pages246-261
Number of pages16
ISBN (Print)0819407712
StatePublished - Jan 1 1992
Externally publishedYes
EventDesign, Modeling, and Control of Laser Beam Optics - Los Angeles, CA, USA
Duration: Jan 21 1992Jan 23 1992

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1625
ISSN (Print)0277-786X

Other

OtherDesign, Modeling, and Control of Laser Beam Optics
CityLos Angeles, CA, USA
Period1/21/921/23/92

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Flagello, D. G., & Milster, T. D. (1992). Three-dimensional modeling of high-numerical-aperture imaging in thin films. In Proceedings of SPIE - The International Society for Optical Engineering (pp. 246-261). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1625). Publ by Int Soc for Optical Engineering.