Three-dimensional polarization ray tracing, retardance

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The retardance associated with a three-by-three polarization ray tracing matrix is analyzed. The retardance of the polarization ray tracing matrix contains both a geometrical transformation and the polarization properties of diattenuation and retardance associated with a ray path through the optical and polarization elements. A method using parallel transport of transverse vectors is able to separate the geometrical transformation from the "physical" retardance, allowing the retardance to be calculated. A non-polarizing ray tracing matrix provides proper local coordinates to calculate the physical retardance without the geometrical transformation.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume7652
DOIs
StatePublished - 2010
EventInternational Optical Design Conference 2010 - Jackson Hole, WY, United States
Duration: Jun 13 2010Jun 17 2010

Other

OtherInternational Optical Design Conference 2010
CountryUnited States
CityJackson Hole, WY
Period6/13/106/17/10

Fingerprint

Ray Tracing
Ray tracing
ray tracing
Polarization
Three-dimensional
polarization
matrices
Parallel Methods
Half line
rays
Transverse
Calculate
Path

Keywords

  • parallel transport
  • polarization ray trace
  • ray tracing
  • retardance

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Yun, G., & Chipman, R. A. (2010). Three-dimensional polarization ray tracing, retardance. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 7652). [76521W] https://doi.org/10.1117/12.868589

Three-dimensional polarization ray tracing, retardance. / Yun, Garam; Chipman, Russell A.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7652 2010. 76521W.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yun, G & Chipman, RA 2010, Three-dimensional polarization ray tracing, retardance. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 7652, 76521W, International Optical Design Conference 2010, Jackson Hole, WY, United States, 6/13/10. https://doi.org/10.1117/12.868589
Yun G, Chipman RA. Three-dimensional polarization ray tracing, retardance. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7652. 2010. 76521W https://doi.org/10.1117/12.868589
Yun, Garam ; Chipman, Russell A. / Three-dimensional polarization ray tracing, retardance. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7652 2010.
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