THz thermal emission control via electromagnetic band engineering

Ian A. Zimmerman, Ziran Wu, Hao Xin, Richard W Ziolkowski

Research output: Contribution to journalArticle

Abstract

In the following, we report on the design and implementation of an inexpensive thermal source for THz radiation with a highly tunable radiation signature. It consists of five 350-μm-thick Si wafers, each spaced 1 mm apart. The thermal emission of this structure was calculated analytically and numerically. A comprehensive study was performed that included analyzing the oblique incidence, polarization, and design tolerance effects. The thermal emission was calculated using both Kirchhoff's law and directly using a Green's function method. It was measured using a Michelson interferometer. The predicted and measured thermal emission spectra had peaks around 150 GHz apart, with a narrow bandwidth of 50 GHz. The peaks were up to 80% of the expected blackbody levels and the bandgaps had emission levels of about 20% of those blackbody values. We demonstrate that, using these techniques, it is possible to achieve a desired THz thermal emission signature, with narrowband features that can be engineered to have specific angles of emission and polarization states.

Original languageEnglish (US)
Article number6728692
Pages (from-to)213-224
Number of pages12
JournalIEEE Transactions on Terahertz Science and Technology
Volume4
Issue number2
DOIs
StatePublished - Mar 2014

Fingerprint

electromagnetic control
Emission control
thermal emission
engineering
Kirchhoff law
signatures
Polarization
Michelson interferometers
polarization
radiation
Radiation
narrowband
emission spectra
Green's functions
Green's function
incidence
wafers
bandwidth
Energy gap
Hot Temperature

Keywords

  • Blackbody radiation
  • electromagnetic bandgap (EBG) structures
  • THz thermal emission

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Radiation

Cite this

THz thermal emission control via electromagnetic band engineering. / Zimmerman, Ian A.; Wu, Ziran; Xin, Hao; Ziolkowski, Richard W.

In: IEEE Transactions on Terahertz Science and Technology, Vol. 4, No. 2, 6728692, 03.2014, p. 213-224.

Research output: Contribution to journalArticle

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