Abstract
Measurement of the transmitted wavefront of domes and windows is a long-standing problem. One may use a large return sphere and measure the interference cavity without the dome present and again with the dome present. The difference between the two measurements is a double-pass measurement of the transmitted wavefront of the dome. Even so, the long coherence length of the source results in many extraneous fringe patterns. Windows may be tested by using a collimated source and return flat. A time-delayed source (TDS) having a short-coherence length is used to obtain a single interference pattern due only to interference of light reflected by the two surfaces of a dome or window. Standard phase shifting algorithms may be used with the TDS to measure the optical thickness of a dome or window without errors due to multiple reflections. Since most of the interferometer is common-path, environmental sensitivity is reduced and alignment is straightforward compared to typical interferometers. Finally, since there is no reference surface, stitching of sub-aperture measurements is simplified.
| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 6545 |
| DOIs | |
| State | Published - 2007 |
| Event | Window and Dome Technologies and Materials X - Orlando, FL, United States Duration: Apr 11 2007 → Apr 12 2007 |
Other
| Other | Window and Dome Technologies and Materials X |
|---|---|
| Country | United States |
| City | Orlando, FL |
| Period | 4/11/07 → 4/12/07 |
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Keywords
- Common path
- Dome
- Multiple reflections
- Phase-shift
- Short coherence
- Stitching
- Time-delay
- Window
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics
Cite this
Time-delayed source and interferometric measurement of domes and windows. / Kuhn, William P.; Dubin, Matthew B.
Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6545 2007. 65450O.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Time-delayed source and interferometric measurement of domes and windows
AU - Kuhn, William P.
AU - Dubin, Matthew B
PY - 2007
Y1 - 2007
N2 - Measurement of the transmitted wavefront of domes and windows is a long-standing problem. One may use a large return sphere and measure the interference cavity without the dome present and again with the dome present. The difference between the two measurements is a double-pass measurement of the transmitted wavefront of the dome. Even so, the long coherence length of the source results in many extraneous fringe patterns. Windows may be tested by using a collimated source and return flat. A time-delayed source (TDS) having a short-coherence length is used to obtain a single interference pattern due only to interference of light reflected by the two surfaces of a dome or window. Standard phase shifting algorithms may be used with the TDS to measure the optical thickness of a dome or window without errors due to multiple reflections. Since most of the interferometer is common-path, environmental sensitivity is reduced and alignment is straightforward compared to typical interferometers. Finally, since there is no reference surface, stitching of sub-aperture measurements is simplified.
AB - Measurement of the transmitted wavefront of domes and windows is a long-standing problem. One may use a large return sphere and measure the interference cavity without the dome present and again with the dome present. The difference between the two measurements is a double-pass measurement of the transmitted wavefront of the dome. Even so, the long coherence length of the source results in many extraneous fringe patterns. Windows may be tested by using a collimated source and return flat. A time-delayed source (TDS) having a short-coherence length is used to obtain a single interference pattern due only to interference of light reflected by the two surfaces of a dome or window. Standard phase shifting algorithms may be used with the TDS to measure the optical thickness of a dome or window without errors due to multiple reflections. Since most of the interferometer is common-path, environmental sensitivity is reduced and alignment is straightforward compared to typical interferometers. Finally, since there is no reference surface, stitching of sub-aperture measurements is simplified.
KW - Common path
KW - Dome
KW - Multiple reflections
KW - Phase-shift
KW - Short coherence
KW - Stitching
KW - Time-delay
KW - Window
UR - http://www.scopus.com/inward/record.url?scp=35649002048&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=35649002048&partnerID=8YFLogxK
U2 - 10.1117/12.718810
DO - 10.1117/12.718810
M3 - Conference contribution
AN - SCOPUS:35649002048
SN - 0819466670
SN - 9780819466679
VL - 6545
BT - Proceedings of SPIE - The International Society for Optical Engineering
ER -