TiO2 thin films: new support materials compatible for transmission electron microscopy and scanning probe microscopy

F. Zenhausern, M. Adrian, P. Descouts

Research output: Contribution to journalArticle

3 Scopus citations

Abstract

In this study, electron transparent specimens for scanning probe microscopy (SFM/STM) and transmission electron microscopy (TEM) were fabricated by vapor deposition on NaCl single crystals, then floated on conventional titanium grids for EM. Electron beam evaporation procedures were also used to fabricate conductive flat titanium dioxide film on mica substrate. The results of the scanning tunneling microscopy (STM) analysis on the thin films mounted onto EM grids indicated that they were mechanically stable and electrically conducting flat surfaces suitable for tunneling imaging. The roughness of the surface was measured to be about 13 nm peak-to-valley and its r.m.s. height variation of 6 nm was compatible with the SFM analysis. The rotary evaporated titanium-coated mica samples were characterized by Auger spectroscopy (AES) prior to SFM measurements. The samples showed a granular structure, with a grain size of 2.5 nm and a low corrugation of about 0.6 nm peak-to-valley.

Original languageEnglish (US)
Pages (from-to)133-137
Number of pages5
JournalColloids and Surfaces B: Biointerfaces
Volume1
Issue number2
DOIs
StatePublished - Jul 19 1993
Externally publishedYes

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Keywords

  • Auger spectroscopy
  • Electron microscopy
  • Scanning force microscopy
  • Scanning tunneling microscopy
  • Thin film
  • TiO

ASJC Scopus subject areas

  • Biotechnology
  • Surfaces and Interfaces
  • Physical and Theoretical Chemistry
  • Colloid and Surface Chemistry

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