Tolerancing considerations for visual systems

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

In designing optical systems where the eye serves as the final detector, assumptions are typically made regarding the optical quality of the eye system. Often, the aberrations of the eye are ignored or minimal adjustments are built into the system under design to handle variations in defocus found within the human population. In general, the eye contains aberrations that vary randomly from person to person. In this investigation, a general technique for creating a random set of aberrations consistent with the statistics of the human eye is developed. These aberrations in turn can be applied to a schematic eye model and their effect on the combined visual instrument/eye system can be determined. Repeated application of different aberration patterns allows for tolerance analysis of performance metrics such of the modulation transfer function (MTF).

Original languageEnglish (US)
Title of host publicationOptical System Alignment, Tolerancing, and Verification VI
DOIs
StatePublished - Dec 1 2012
EventOptical System Alignment, Tolerancing, and Verification VI - San Diego, CA, United States
Duration: Aug 12 2012Aug 13 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8491
ISSN (Print)0277-786X

Other

OtherOptical System Alignment, Tolerancing, and Verification VI
CountryUnited States
CitySan Diego, CA
Period8/12/128/13/12

Keywords

  • MTF
  • Ocular aberrations
  • Schematic eye
  • Tolerancing
  • Visual instruments
  • Wavefront sensing

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Schwiegerling, J. (2012). Tolerancing considerations for visual systems. In Optical System Alignment, Tolerancing, and Verification VI [849104] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8491). https://doi.org/10.1117/12.930796