Total Integrated Scatter instrument for in-space monitoring of surface degradation

Joseph Larry Pezzaniti, James B. Hadaway, Russell A Chipman, Don Wilkes, Lee Hummer, Jean Bennett

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

A Total Integrated Scatter (TIS) system was built to test the viability of a TIS instrument to be used in space to monitor damage to optical and thermal control surfaces due to the low earth orbit environment. The systems accuracy and repeatability in detecting changes in the surface quality of various space materials after exposure to atomic oxygen was tested. A method for distinguishing roughening of a surface from dust contamination is described.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsPeter A. Glassford
PublisherPubl by Int Soc for Optical Engineering
Pages200-210
Number of pages11
Volume1329
StatePublished - 1990
Externally publishedYes
EventOptical System Contamination: Effects, Measurement, Control II - San Diego, CA, USA
Duration: Jul 10 1990Jul 12 1990

Other

OtherOptical System Contamination: Effects, Measurement, Control II
CitySan Diego, CA, USA
Period7/10/907/12/90

Fingerprint

Control surfaces
Surface properties
Dust
Orbits
Contamination
Earth (planet)
degradation
Degradation
control surfaces
optical control
Oxygen
Monitoring
low Earth orbits
viability
contamination
dust
damage
oxygen
Hot Temperature

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Pezzaniti, J. L., Hadaway, J. B., Chipman, R. A., Wilkes, D., Hummer, L., & Bennett, J. (1990). Total Integrated Scatter instrument for in-space monitoring of surface degradation. In P. A. Glassford (Ed.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 1329, pp. 200-210). Publ by Int Soc for Optical Engineering.

Total Integrated Scatter instrument for in-space monitoring of surface degradation. / Pezzaniti, Joseph Larry; Hadaway, James B.; Chipman, Russell A; Wilkes, Don; Hummer, Lee; Bennett, Jean.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / Peter A. Glassford. Vol. 1329 Publ by Int Soc for Optical Engineering, 1990. p. 200-210.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Pezzaniti, JL, Hadaway, JB, Chipman, RA, Wilkes, D, Hummer, L & Bennett, J 1990, Total Integrated Scatter instrument for in-space monitoring of surface degradation. in PA Glassford (ed.), Proceedings of SPIE - The International Society for Optical Engineering. vol. 1329, Publ by Int Soc for Optical Engineering, pp. 200-210, Optical System Contamination: Effects, Measurement, Control II, San Diego, CA, USA, 7/10/90.
Pezzaniti JL, Hadaway JB, Chipman RA, Wilkes D, Hummer L, Bennett J. Total Integrated Scatter instrument for in-space monitoring of surface degradation. In Glassford PA, editor, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 1329. Publ by Int Soc for Optical Engineering. 1990. p. 200-210
Pezzaniti, Joseph Larry ; Hadaway, James B. ; Chipman, Russell A ; Wilkes, Don ; Hummer, Lee ; Bennett, Jean. / Total Integrated Scatter instrument for in-space monitoring of surface degradation. Proceedings of SPIE - The International Society for Optical Engineering. editor / Peter A. Glassford. Vol. 1329 Publ by Int Soc for Optical Engineering, 1990. pp. 200-210
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