Towards industrial inspection with THz systems

M. Stecher, C. Jördens, N. Krumbholz, C. Jansen, Maik A Scheller, R. Wilk, O. Peters, B. Scherger, B. Ewers, M. Koch

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

Due to their high spatial resolution, THz imaging systems (based on time domain spectrometers) have a broad variety of applications in scientific as well as industrial applications in the future—especially through the upcoming of reliable titanium sapphire lasers and fiber amplified femtosecond lasers. With such THz scanning highly sensitive measurements of materials as well as physical phenomena and simultaneously real-time imaging with real-time data extraction can be realized which can be used for production monitoring and/or more accurate and novel inlsine control systems. The article gives an overview on recent state of the art THz systems based on femtosecond lasers and their application scenarios, like detection.

Original languageEnglish (US)
Pages (from-to)311-335
Number of pages25
JournalSpringer Series in Optical Sciences
Volume195
DOIs
StatePublished - 2016

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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