A new class of bit flipping algorithms for lowdensity parity-check codes over the binary symmetric channel is proposed. Compared to the regular (parallel or serial) bit flipping algorithms, the proposed algorithms employ one additional bit at a variable node to represent its "strength." The introduction of this additional bit allows an increase in the guaranteed error correction capability. An additional bit is also employed at a check node to capture information which is beneficial to decoding. A framework for failure analysis and selection of two-bit bit flipping algorithms is provided. The main component of this framework is the (re)definition of trapping sets, which are the most "compact" Tanner graphs that cause decoding failures of an algorithm. A recursive procedure to enumerate trapping sets is described. This procedure is the basis for selecting a collection of algorithms that work well together. It is demonstrated that decoders which employ a properly selected group of the proposed algorithms operating in parallel can offer high speed and low error floor decoding.
- Bit flipping algorithms
- error floor
- low-density parity-check codes
- trapping set
ASJC Scopus subject areas
- Electrical and Electronic Engineering