Two-dimensional imaging theory of confocal self-interference microscopy

Dong Kyun Kang, Dae Gab Gweon

Research output: Contribution to journalArticle

3 Scopus citations

Abstract

A two-dimensional coherent imaging equation is derived for confocal self-interference microscopy (CSIM), which uses a birefringent material to generate an interference pattern in the detection optics. This interference pattern, called a self-interference pattern, sharpens the point-spread function (PSF) along the lateral direction. To derive the imaging equation, an equation for the self-interference pattern is derived. Numerical simulation results based on the imaging equation are presented. One-point response results show a 42.8% reduction in the FWHM of the lateral PSF. Two-point response results show a nearly twofold improvement in two-point resolution.

Original languageEnglish (US)
Pages (from-to)2737-2745
Number of pages9
JournalJournal of the Optical Society of America A: Optics and Image Science, and Vision
Volume22
Issue number12
DOIs
StatePublished - Dec 2005
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Computer Vision and Pattern Recognition

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