UFF belt characterization

Philip Katz, Timothy Lynch, Alexander Magill, Jakob Maag-Tanchack, Jonathan D. Ellis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Research was conducted on the belts used in OptiPro's UltraForm Finishing (UFF) system to better understand the fundamental mechanics of wear and material removal rates during belt polishing.

Original languageEnglish (US)
Title of host publicationApplied Industrial Optics
Subtitle of host publicationSpectroscopy, Imaging and Metrology, AIO 2012
PagesJTu5A.2
StatePublished - Dec 1 2012
Externally publishedYes
EventApplied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2012 - Monterey, CA, United States
Duration: Jun 24 2012Jun 28 2012

Publication series

NameApplied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2012

Conference

ConferenceApplied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2012
CountryUnited States
CityMonterey, CA
Period6/24/126/28/12

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Fingerprint Dive into the research topics of 'UFF belt characterization'. Together they form a unique fingerprint.

  • Cite this

    Katz, P., Lynch, T., Magill, A., Maag-Tanchack, J., & Ellis, J. D. (2012). UFF belt characterization. In Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2012 (pp. JTu5A.2). (Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2012).