Ultrafast nonlinear sub-wavelength solid immersion spectroscopy at T = 8 K

An alternative to nonlinear scanning near-field optical microscopy

M. Vollmer, Harald Giessen, W. Stolz, W. W. Rühle, A. Knorr, Stephan W Koch, L. Ghislain, V. Elings

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Pump-probe measurements were performed with a sub-wavelength spatial resolution of 355 nm and a temporal resolution of 130 fs in a multiple quantum well sample at T = 8 K. A solid immersion lens was used to increase the spatial resolution to 0.41 λ, demonstrating that the limit of conventional microscopy was surpassed.

Original languageEnglish (US)
Pages (from-to)523-527
Number of pages5
JournalJournal of Microscopy
Volume194
Issue number2-3
DOIs
StatePublished - 1999
Externally publishedYes

Fingerprint

Near field scanning optical microscopy
Immersion
Semiconductor quantum wells
submerging
Lenses
Microscopy
Spectrum Analysis
near fields
Microscopic examination
spatial resolution
Pumps
Spectroscopy
microscopy
Wavelength
scanning
temporal resolution
wavelengths
spectroscopy
lenses
quantum wells

Keywords

  • Pump-probe spectroscopy
  • Semiconductors
  • Solid immersion lens
  • Ultrafast spectroscopy

ASJC Scopus subject areas

  • Instrumentation

Cite this

Ultrafast nonlinear sub-wavelength solid immersion spectroscopy at T = 8 K : An alternative to nonlinear scanning near-field optical microscopy. / Vollmer, M.; Giessen, Harald; Stolz, W.; Rühle, W. W.; Knorr, A.; Koch, Stephan W; Ghislain, L.; Elings, V.

In: Journal of Microscopy, Vol. 194, No. 2-3, 1999, p. 523-527.

Research output: Contribution to journalArticle

Vollmer, M. ; Giessen, Harald ; Stolz, W. ; Rühle, W. W. ; Knorr, A. ; Koch, Stephan W ; Ghislain, L. ; Elings, V. / Ultrafast nonlinear sub-wavelength solid immersion spectroscopy at T = 8 K : An alternative to nonlinear scanning near-field optical microscopy. In: Journal of Microscopy. 1999 ; Vol. 194, No. 2-3. pp. 523-527.
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