Ultraviolet polarimeter for characterization of an imaging spectrometer

M. Frank Morgan, Russell A Chipman, G. Douglas Torr

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

A polarimeter for characterization of the instrumental polarization of an imaging ultraviolet (UV) spectrometer has been designed and calibrated. The spectrometer is a diffraction grating spectrograph and is therefore expected to show strong polarization effects. Since the spectrometer is used for observations of partially polarized light, we need to measure the sensitivity of the spectrometer to the polarization state of incident light. A dual rotating retarder polarimeter has been developed to address this need. The polarimeter includes a linear diattenuator and a rotating retrader to control the polarization state of light entering the spectrometer, and a similar pair of elements to analyze the polarization state of light emerging from the instrument. With this polarimeter it is possible to measure the Mueller matrix of the spectrometer as a function of wavelength. In the course of calibrating the polarimeter, the quarter-wave retarders were observed to possess polarization properties other than pure linear retardance. This forced the development of a complex procedure for the calibration of the retarders and a new generalized approach to polarimetric analysis. These developments are the main subjects of this paper

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsRussel A. Chipman, John W. Morris
PublisherPubl by Int Soc for Optical Engineering
Pages384-394
Number of pages11
Volume1317
ISBN (Print)0819403725
StatePublished - 1990
Externally publishedYes
EventPolarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray - Huntsville, AL, USA
Duration: May 15 1990May 17 1990

Other

OtherPolarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray
CityHuntsville, AL, USA
Period5/15/905/17/90

Fingerprint

Polarimeters
imaging spectrometers
polarimeters
Spectrometers
Polarization
Imaging techniques
retarders
spectrometers
polarization
Ultraviolet spectrometers
ultraviolet spectrometers
Spectrographs
Diffraction gratings
Light polarization
calibrating
gratings (spectra)
polarized light
spectrographs
emerging
Calibration

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Morgan, M. F., Chipman, R. A., & Torr, G. D. (1990). Ultraviolet polarimeter for characterization of an imaging spectrometer. In R. A. Chipman, & J. W. Morris (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 1317, pp. 384-394). Publ by Int Soc for Optical Engineering.

Ultraviolet polarimeter for characterization of an imaging spectrometer. / Morgan, M. Frank; Chipman, Russell A; Torr, G. Douglas.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / Russel A. Chipman; John W. Morris. Vol. 1317 Publ by Int Soc for Optical Engineering, 1990. p. 384-394.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Morgan, MF, Chipman, RA & Torr, GD 1990, Ultraviolet polarimeter for characterization of an imaging spectrometer. in RA Chipman & JW Morris (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 1317, Publ by Int Soc for Optical Engineering, pp. 384-394, Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray, Huntsville, AL, USA, 5/15/90.
Morgan MF, Chipman RA, Torr GD. Ultraviolet polarimeter for characterization of an imaging spectrometer. In Chipman RA, Morris JW, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 1317. Publ by Int Soc for Optical Engineering. 1990. p. 384-394
Morgan, M. Frank ; Chipman, Russell A ; Torr, G. Douglas. / Ultraviolet polarimeter for characterization of an imaging spectrometer. Proceedings of SPIE - The International Society for Optical Engineering. editor / Russel A. Chipman ; John W. Morris. Vol. 1317 Publ by Int Soc for Optical Engineering, 1990. pp. 384-394
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