Use of a flat panel display for measurement of sine condition violations

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations


Previous works have shown the viability of using the Sine Condition Test (SCTest) to verify the alignment of optical systems. The SCTest uses the Abbe sine condition to measure the mapping between the entrance and exit pupils of an optical system. From this pupil mapping, the linearly-field dependent aberrations can be measured and used to verify the alignment. Specifically, the linear astigmatism is used as a metric to determine how well the optical system is aligned. An advantage to using the sine condition to measure the off-axis performance is that the measurement equipment can be placed on-axis. By doing this, the uncertainty of the measurement is reduced, making this test especially useful for verifying systems with large inherent aberrations. In this paper, we expand the design space of the SCTest by exploring the two different source options: a point source with a grating or a flat-panel display. Additionally, we show experimental results of implementing the SCTest using a flat-panel display. Last, we explain how the SCTest can be implemented on more complex systems, such as a three-mirror anastigmat (TMA) and a double Gauss. By exploring the design space, we provide more design options for selecting the SCTest source, increasing the flexibility and utility of the SCTest.

Original languageEnglish (US)
Title of host publicationOptical System Alignment, Tolerancing, and Verification VI
StatePublished - Dec 1 2012
EventOptical System Alignment, Tolerancing, and Verification VI - San Diego, CA, United States
Duration: Aug 12 2012Aug 13 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X


OtherOptical System Alignment, Tolerancing, and Verification VI
Country/TerritoryUnited States
CitySan Diego, CA


  • Geometrical optics
  • Monochromatic aberrations
  • Optical imaging
  • Optical system alignment
  • Optical system verification
  • Optical systems
  • Optics
  • Sine condition

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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