UV photon-counting CCD detectors that enable the next generation of UV spectroscopy missions: AR coatings that can achieve 80-90% QE

Erika T. Hamden, Frank Greer, David Schiminovich, Shouleh Nikzad, D. Christopher Martin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

We describe recent progress in the development of anti-reection coatings for use at UV wavelengths on CCDs and other Si-based detectors. We have previously demonstrated a set of coatings which are able to achieve greater than 50% QE in 4 bands from 130nm to greater than 300nm. We now present new refinements of these AR-coatings which will improve performance in a narrower bandpass by 50% over previous work. Successful test films have been made to optimize transmission at 190nm, reaching 80% potential transmission.

Original languageEnglish (US)
Title of host publicationHigh Energy, Optical, and Infrared Detectors for Astronomy V
DOIs
StatePublished - Dec 1 2012
Externally publishedYes
EventHigh Energy, Optical, and Infrared Detectors for Astronomy V - Amsterdam, Netherlands
Duration: Jul 1 2012Jul 4 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8453
ISSN (Print)0277-786X

Other

OtherHigh Energy, Optical, and Infrared Detectors for Astronomy V
CountryNetherlands
CityAmsterdam
Period7/1/127/4/12

Keywords

  • Anti-reection coatings
  • CCDs
  • Thin-films
  • UV

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Hamden, E. T., Greer, F., Schiminovich, D., Nikzad, S., & Martin, D. C. (2012). UV photon-counting CCD detectors that enable the next generation of UV spectroscopy missions: AR coatings that can achieve 80-90% QE. In High Energy, Optical, and Infrared Detectors for Astronomy V [845309] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8453). https://doi.org/10.1117/12.927208