UV photon-counting CCD detectors that enable the next generation of UV spectroscopy missions: AR coatings that can achieve 80-90% QE

Erika T. Hamden; Frank Greer; David Schiminovich; Shouleh Nikzad; D. Christopher Martin

doi:10.1117/12.927208

UV photon-counting CCD detectors that enable the next generation of UV spectroscopy missions: AR coatings that can achieve 80-90% QE

Erika T. Hamden, Frank Greer, David Schiminovich, Shouleh Nikzad, D. Christopher Martin

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Scopus citations

Abstract

We describe recent progress in the development of anti-reection coatings for use at UV wavelengths on CCDs and other Si-based detectors. We have previously demonstrated a set of coatings which are able to achieve greater than 50% QE in 4 bands from 130nm to greater than 300nm. We now present new refinements of these AR-coatings which will improve performance in a narrower bandpass by 50% over previous work. Successful test films have been made to optimize transmission at 190nm, reaching 80% potential transmission.

Original language	English (US)
Title of host publication	High Energy, Optical, and Infrared Detectors for Astronomy V
DOIs	https://doi.org/10.1117/12.927208
State	Published - Dec 1 2012
Externally published	Yes
Event	High Energy, Optical, and Infrared Detectors for Astronomy V - Amsterdam, Netherlands Duration: Jul 1 2012 → Jul 4 2012

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	8453
ISSN (Print)	0277-786X

Other

Other	High Energy, Optical, and Infrared Detectors for Astronomy V
Country	Netherlands
City	Amsterdam
Period	7/1/12 → 7/4/12

Keywords

Anti-reection coatings
CCDs
Thin-films
UV

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.927208

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Cite this

Hamden, E. T., Greer, F., Schiminovich, D., Nikzad, S., & Martin, D. C. (2012). UV photon-counting CCD detectors that enable the next generation of UV spectroscopy missions: AR coatings that can achieve 80-90% QE. In High Energy, Optical, and Infrared Detectors for Astronomy V [845309] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8453). https://doi.org/10.1117/12.927208

UV photon-counting CCD detectors that enable the next generation of UV spectroscopy missions : AR coatings that can achieve 80-90% QE. / Hamden, Erika T.; Greer, Frank; Schiminovich, David; Nikzad, Shouleh; Martin, D. Christopher.

High Energy, Optical, and Infrared Detectors for Astronomy V. 2012. 845309 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8453).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Hamden, ET, Greer, F, Schiminovich, D, Nikzad, S & Martin, DC 2012, UV photon-counting CCD detectors that enable the next generation of UV spectroscopy missions: AR coatings that can achieve 80-90% QE. in High Energy, Optical, and Infrared Detectors for Astronomy V., 845309, Proceedings of SPIE - The International Society for Optical Engineering, vol. 8453, High Energy, Optical, and Infrared Detectors for Astronomy V, Amsterdam, Netherlands, 7/1/12. https://doi.org/10.1117/12.927208

Hamden ET, Greer F, Schiminovich D, Nikzad S, Martin DC. UV photon-counting CCD detectors that enable the next generation of UV spectroscopy missions: AR coatings that can achieve 80-90% QE. In High Energy, Optical, and Infrared Detectors for Astronomy V. 2012. 845309. (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.927208

Hamden, Erika T. ; Greer, Frank ; Schiminovich, David ; Nikzad, Shouleh ; Martin, D. Christopher. / UV photon-counting CCD detectors that enable the next generation of UV spectroscopy missions : AR coatings that can achieve 80-90% QE. High Energy, Optical, and Infrared Detectors for Astronomy V. 2012. (Proceedings of SPIE - The International Society for Optical Engineering).

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