Variation on Zernike's phase-contrast microscope

Research output: Contribution to journalArticle

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Abstract

We describe the design, construction, and testing of a variant of Zernike's phase-contrast microscope. The sample is illuminated with a white-light source through an annular aperture, which is projected onto the entrance pupil of the objective lens. In the return path the light diffracted by the sample and appearing in the interior of the objective's aperture (i.e., the test beam) is separated from the light returning in the annular region near the rim of the objective (i.e., the reference beam). The separated beams are relatively phase shifted and then combined to create an interferogram of the sample's surface on a CCD camera. It is fairly straightforward to use this system as a conventional bright-field or dark-field microscope, but its most interesting application is as a Zernike phase-contrast microscope with adjustable amplitude ratio and phase shift between test and reference beams. The ability to continuously adjust the phase of the reference beam also enables quantitative measurement of the phase imparted by the sample to the incident beam.

Original languageEnglish (US)
Pages (from-to)2152-2158
Number of pages7
JournalApplied Optics
Volume39
Issue number13
StatePublished - May 1 2000

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phase contrast
Microscopes
microscopes
CCD cameras
Phase shift
Light sources
Lenses
apertures
Testing
pupils
rims
entrances
light sources
interferometry
phase shift
lenses
shift

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Variation on Zernike's phase-contrast microscope. / Liang, Rongguang; Erwin, J. Kevin; Mansuripur, Masud.

In: Applied Optics, Vol. 39, No. 13, 01.05.2000, p. 2152-2158.

Research output: Contribution to journalArticle

Liang, Rongguang ; Erwin, J. Kevin ; Mansuripur, Masud. / Variation on Zernike's phase-contrast microscope. In: Applied Optics. 2000 ; Vol. 39, No. 13. pp. 2152-2158.
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