Versatile polychromatic dynamic testbed for testing of optical disks

Masud Mansuripur, J. Kevin Erwin, Warren Bletscher, S. G. Kim, S. K. Lee, Chubing Peng, R. E. Gerber, Keith Bates, Chanda Bartlett, T. D. Goodman, Lu Cheng, Chong Sam Chung, Taekyung Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A dynamic testbed has been designed and constructed for the evaluation of optical disks. Within the wavelength range of 440 nm to 690 nm, the system is achromatic, allowing any light source in this range to be utilized for read/write/erase experiments. The system also accepts disks with substrate thickness ranging from 0 to 1.7 mm. The testbed handles polarization such that with a turn of a knob, one can generate either linearly-polarized or circularly-polarized light at the disk surface. Focus error detection is based on the astigmatic method, and the primary track error detection scheme is the push pull method. The detection channel consists of two high-speed quad detectors mounted on the two arms of a differential detection module.

Original languageEnglish (US)
Title of host publicationTopical Meeting on Optical Data Storage - Digest of Technical Papers
Editors Anon
PublisherOptical Soc of America
Pages94-95
Number of pages2
StatePublished - 1997
EventProceedings of the 1997 Optical Data Storage Topical Meeting, ODS - Tucson, AZ, USA
Duration: Apr 7 1997Apr 9 1997

Other

OtherProceedings of the 1997 Optical Data Storage Topical Meeting, ODS
CityTucson, AZ, USA
Period4/7/974/9/97

Fingerprint

Error detection
Testbeds
Knobs
Testing
Light polarization
Light sources
Polarization
Detectors
Wavelength
Substrates
Experiments

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Mansuripur, M., Erwin, J. K., Bletscher, W., Kim, S. G., Lee, S. K., Peng, C., ... Kim, T. (1997). Versatile polychromatic dynamic testbed for testing of optical disks. In Anon (Ed.), Topical Meeting on Optical Data Storage - Digest of Technical Papers (pp. 94-95). Optical Soc of America.

Versatile polychromatic dynamic testbed for testing of optical disks. / Mansuripur, Masud; Erwin, J. Kevin; Bletscher, Warren; Kim, S. G.; Lee, S. K.; Peng, Chubing; Gerber, R. E.; Bates, Keith; Bartlett, Chanda; Goodman, T. D.; Cheng, Lu; Chung, Chong Sam; Kim, Taekyung.

Topical Meeting on Optical Data Storage - Digest of Technical Papers. ed. / Anon. Optical Soc of America, 1997. p. 94-95.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Mansuripur, M, Erwin, JK, Bletscher, W, Kim, SG, Lee, SK, Peng, C, Gerber, RE, Bates, K, Bartlett, C, Goodman, TD, Cheng, L, Chung, CS & Kim, T 1997, Versatile polychromatic dynamic testbed for testing of optical disks. in Anon (ed.), Topical Meeting on Optical Data Storage - Digest of Technical Papers. Optical Soc of America, pp. 94-95, Proceedings of the 1997 Optical Data Storage Topical Meeting, ODS, Tucson, AZ, USA, 4/7/97.
Mansuripur M, Erwin JK, Bletscher W, Kim SG, Lee SK, Peng C et al. Versatile polychromatic dynamic testbed for testing of optical disks. In Anon, editor, Topical Meeting on Optical Data Storage - Digest of Technical Papers. Optical Soc of America. 1997. p. 94-95
Mansuripur, Masud ; Erwin, J. Kevin ; Bletscher, Warren ; Kim, S. G. ; Lee, S. K. ; Peng, Chubing ; Gerber, R. E. ; Bates, Keith ; Bartlett, Chanda ; Goodman, T. D. ; Cheng, Lu ; Chung, Chong Sam ; Kim, Taekyung. / Versatile polychromatic dynamic testbed for testing of optical disks. Topical Meeting on Optical Data Storage - Digest of Technical Papers. editor / Anon. Optical Soc of America, 1997. pp. 94-95
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