VERY HIGH YIELD ELECTRON IMPACT ION SOURCE FOR ANALYTICAL MASS SPECTROMETRY.

S. L. Koontz, M Bonner Denton

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationAnnual Conference on Mass Spectrometry and Allied Topics
PublisherAm Soc for Mass Spectrom
Pages527-528
Number of pages2
StatePublished - 1982
Externally publishedYes

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Ion sources
Mass spectrometry
Electrons

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Koontz, S. L., & Denton, M. B. (1982). VERY HIGH YIELD ELECTRON IMPACT ION SOURCE FOR ANALYTICAL MASS SPECTROMETRY. In Annual Conference on Mass Spectrometry and Allied Topics (pp. 527-528). Am Soc for Mass Spectrom.

VERY HIGH YIELD ELECTRON IMPACT ION SOURCE FOR ANALYTICAL MASS SPECTROMETRY. / Koontz, S. L.; Denton, M Bonner.

Annual Conference on Mass Spectrometry and Allied Topics. Am Soc for Mass Spectrom, 1982. p. 527-528.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Koontz, SL & Denton, MB 1982, VERY HIGH YIELD ELECTRON IMPACT ION SOURCE FOR ANALYTICAL MASS SPECTROMETRY. in Annual Conference on Mass Spectrometry and Allied Topics. Am Soc for Mass Spectrom, pp. 527-528.
Koontz SL, Denton MB. VERY HIGH YIELD ELECTRON IMPACT ION SOURCE FOR ANALYTICAL MASS SPECTROMETRY. In Annual Conference on Mass Spectrometry and Allied Topics. Am Soc for Mass Spectrom. 1982. p. 527-528
Koontz, S. L. ; Denton, M Bonner. / VERY HIGH YIELD ELECTRON IMPACT ION SOURCE FOR ANALYTICAL MASS SPECTROMETRY. Annual Conference on Mass Spectrometry and Allied Topics. Am Soc for Mass Spectrom, 1982. pp. 527-528
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