Abstract
The University of Arizona Imaging Technology Laboratoryhas processed several types of very large format (>4K × 4K pixel) charge coupled devices for low light level scientific applications. These back illuminated deviceswere produced from frontside die fabricated by or for Fairchild Imaging Systems, Semiconductor Technology Associates, the Jet Propulsion Laboratory, and Kodak. A Philips 7K × 9K frontside device has also been processed using similar techniques. The backside sensors yield >90% quantum efficiency (QE). All devices show excellent charge transfer efficiency (CTE > 0.999997) at operating temperatures (typically -100 °C). Devices specifically designed for low signal applications have been demonstrated with less than 4 electrons read noise.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 77-82 |
| Number of pages | 6 |
| Journal | Experimental Astronomy |
| Volume | 14 |
| Issue number | 2 |
| DOIs | |
| State | Published - Oct 2002 |
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Keywords
- Astronomy
- Charge-Coupled Device (CCD)
- Detectors
- Imaging
- Silicon
ASJC Scopus subject areas
- Astronomy and Astrophysics
- Space and Planetary Science
Cite this
Very large format back illuminated CCDs. / Lesser, Michael P.
In: Experimental Astronomy, Vol. 14, No. 2, 10.2002, p. 77-82.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Very large format back illuminated CCDs
AU - Lesser, Michael P
PY - 2002/10
Y1 - 2002/10
N2 - The University of Arizona Imaging Technology Laboratoryhas processed several types of very large format (>4K × 4K pixel) charge coupled devices for low light level scientific applications. These back illuminated deviceswere produced from frontside die fabricated by or for Fairchild Imaging Systems, Semiconductor Technology Associates, the Jet Propulsion Laboratory, and Kodak. A Philips 7K × 9K frontside device has also been processed using similar techniques. The backside sensors yield >90% quantum efficiency (QE). All devices show excellent charge transfer efficiency (CTE > 0.999997) at operating temperatures (typically -100 °C). Devices specifically designed for low signal applications have been demonstrated with less than 4 electrons read noise.
AB - The University of Arizona Imaging Technology Laboratoryhas processed several types of very large format (>4K × 4K pixel) charge coupled devices for low light level scientific applications. These back illuminated deviceswere produced from frontside die fabricated by or for Fairchild Imaging Systems, Semiconductor Technology Associates, the Jet Propulsion Laboratory, and Kodak. A Philips 7K × 9K frontside device has also been processed using similar techniques. The backside sensors yield >90% quantum efficiency (QE). All devices show excellent charge transfer efficiency (CTE > 0.999997) at operating temperatures (typically -100 °C). Devices specifically designed for low signal applications have been demonstrated with less than 4 electrons read noise.
KW - Astronomy
KW - Charge-Coupled Device (CCD)
KW - Detectors
KW - Imaging
KW - Silicon
UR - http://www.scopus.com/inward/record.url?scp=12744270026&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=12744270026&partnerID=8YFLogxK
U2 - 10.1023/B:EXPA.0000004337.06411.0d
DO - 10.1023/B:EXPA.0000004337.06411.0d
M3 - Article
AN - SCOPUS:12744270026
VL - 14
SP - 77
EP - 82
JO - Experimental Astronomy
JF - Experimental Astronomy
SN - 0922-6435
IS - 2
ER -