Visible Mueller matrix spectropolarimetry

Elizabeth A. Sornsin, Russell A Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

A Mueller matrix spectropolarimeter operating between 400-900nm has been developed for optical element characterization at The University of Alabama in Huntsville. Mueller matrices are measured as a function of wavelength and the spectral behavior of the polarization properties can be determined. Measurements of an achromatic retarder in transmission, a reflective beamsplitter, and the electro-optic dispersion of a spatial light modulator will be presented.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsD.H. Goldstein, R.A. Chipman
Pages156-160
Number of pages5
Volume3121
DOIs
StatePublished - 1997
Externally publishedYes
EventPolarization: Measurement, Analysis, and Remote Sensing - San Diego, CA, United States
Duration: Jul 30 1997Aug 1 1997

Other

OtherPolarization: Measurement, Analysis, and Remote Sensing
CountryUnited States
CitySan Diego, CA
Period7/30/978/1/97

Fingerprint

Electrooptical effects
Optical devices
Polarization
Wavelength
retarders
polarimeters
light modulators
matrices
electro-optics
polarization
wavelengths
Spatial light modulators

Keywords

  • Electro-optic dispersion
  • Mueller matrix
  • Spectropolarimetry

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Sornsin, E. A., & Chipman, R. A. (1997). Visible Mueller matrix spectropolarimetry. In D. H. Goldstein, & R. A. Chipman (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3121, pp. 156-160) https://doi.org/10.1117/12.283855

Visible Mueller matrix spectropolarimetry. / Sornsin, Elizabeth A.; Chipman, Russell A.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / D.H. Goldstein; R.A. Chipman. Vol. 3121 1997. p. 156-160.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sornsin, EA & Chipman, RA 1997, Visible Mueller matrix spectropolarimetry. in DH Goldstein & RA Chipman (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 3121, pp. 156-160, Polarization: Measurement, Analysis, and Remote Sensing, San Diego, CA, United States, 7/30/97. https://doi.org/10.1117/12.283855
Sornsin EA, Chipman RA. Visible Mueller matrix spectropolarimetry. In Goldstein DH, Chipman RA, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3121. 1997. p. 156-160 https://doi.org/10.1117/12.283855
Sornsin, Elizabeth A. ; Chipman, Russell A. / Visible Mueller matrix spectropolarimetry. Proceedings of SPIE - The International Society for Optical Engineering. editor / D.H. Goldstein ; R.A. Chipman. Vol. 3121 1997. pp. 156-160
@inproceedings{1b7ea9f7f69741c8b883cb82ef63fd5f,
title = "Visible Mueller matrix spectropolarimetry",
abstract = "A Mueller matrix spectropolarimeter operating between 400-900nm has been developed for optical element characterization at The University of Alabama in Huntsville. Mueller matrices are measured as a function of wavelength and the spectral behavior of the polarization properties can be determined. Measurements of an achromatic retarder in transmission, a reflective beamsplitter, and the electro-optic dispersion of a spatial light modulator will be presented.",
keywords = "Electro-optic dispersion, Mueller matrix, Spectropolarimetry",
author = "Sornsin, {Elizabeth A.} and Chipman, {Russell A}",
year = "1997",
doi = "10.1117/12.283855",
language = "English (US)",
volume = "3121",
pages = "156--160",
editor = "D.H. Goldstein and R.A. Chipman",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",

}

TY - GEN

T1 - Visible Mueller matrix spectropolarimetry

AU - Sornsin, Elizabeth A.

AU - Chipman, Russell A

PY - 1997

Y1 - 1997

N2 - A Mueller matrix spectropolarimeter operating between 400-900nm has been developed for optical element characterization at The University of Alabama in Huntsville. Mueller matrices are measured as a function of wavelength and the spectral behavior of the polarization properties can be determined. Measurements of an achromatic retarder in transmission, a reflective beamsplitter, and the electro-optic dispersion of a spatial light modulator will be presented.

AB - A Mueller matrix spectropolarimeter operating between 400-900nm has been developed for optical element characterization at The University of Alabama in Huntsville. Mueller matrices are measured as a function of wavelength and the spectral behavior of the polarization properties can be determined. Measurements of an achromatic retarder in transmission, a reflective beamsplitter, and the electro-optic dispersion of a spatial light modulator will be presented.

KW - Electro-optic dispersion

KW - Mueller matrix

KW - Spectropolarimetry

UR - http://www.scopus.com/inward/record.url?scp=0031289001&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0031289001&partnerID=8YFLogxK

U2 - 10.1117/12.283855

DO - 10.1117/12.283855

M3 - Conference contribution

VL - 3121

SP - 156

EP - 160

BT - Proceedings of SPIE - The International Society for Optical Engineering

A2 - Goldstein, D.H.

A2 - Chipman, R.A.

ER -