Visible Mueller matrix spectropolarimetry

Elizabeth A. Sornsin, Russell A. Chipman

Research output: Contribution to journalConference article

7 Scopus citations

Abstract

A Mueller matrix spectropolarimeter operating between 400-900nm has been developed for optical element characterization at The University of Alabama in Huntsville. Mueller matrices are measured as a function of wavelength and the spectral behavior of the polarization properties can be determined. Measurements of an achromatic retarder in transmission, a reflective beamsplitter, and the electro-optic dispersion of a spatial light modulator will be presented.

Original languageEnglish (US)
Pages (from-to)156-160
Number of pages5
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3121
DOIs
StatePublished - Dec 1 1997
Externally publishedYes
EventPolarization: Measurement, Analysis, and Remote Sensing - San Diego, CA, United States
Duration: Jul 30 1997Aug 1 1997

Keywords

  • Electro-optic dispersion
  • Mueller matrix
  • Spectropolarimetry

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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