Waveguide Zeeman interferometry for thin-film chemical sensors

K. M. Grace, K. Shrouf, S. Honkanen, P. Äyräs, P. Katila, M. Leppihalme, R. G. Johnston, X. Yang, B. Swanson, N. Peyghambarian

Research output: Contribution to journalArticle

10 Scopus citations

Abstract

The authors demonstrate a highly sensitive chemical sensor scheme based on Si3N4 channel waveguides, species-selective surface coatings and Zeeman interferometry. The relative phase change between the TE and TM modes under exposure to toluene vapour is measured. The measurements demonstrate the real-time and reversible response with good sensitivity at low concentrations.

Original languageEnglish (US)
Pages (from-to)1651-1653
Number of pages3
JournalElectronics Letters
Volume33
Issue number19
DOIs
StatePublished - Sep 11 1997

Keywords

  • Chemical sensors
  • Light interferometry
  • Optical waveguides

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Grace, K. M., Shrouf, K., Honkanen, S., Äyräs, P., Katila, P., Leppihalme, M., Johnston, R. G., Yang, X., Swanson, B., & Peyghambarian, N. (1997). Waveguide Zeeman interferometry for thin-film chemical sensors. Electronics Letters, 33(19), 1651-1653. https://doi.org/10.1049/el:19971108