Wavelet analysis of fretting experimental data

George N Frantziskonis, E. Shell, J. Woo, T. E. Matikas, P. D. Nicolaou

Research output: Chapter in Book/Report/Conference proceedingChapter

2 Citations (Scopus)

Abstract

Wavelet analysis is applied to the characterization of the fretting damage of materials. Two cases are considered. In the first case, fretted surfaces in a Ti-6Al-4V alloy are quantitatively characterized by analyzing profilometric digital images of fretted surfaces. Through wavelet analysis, dominant length scales are determined as those regions in the scale-space where the energy of the wavelet transform and/or peaks of local concentration dominate. The second use of wavelets deals with the non-uniformity of the contact regions. In particular, wavelet analysis is employed to identify those regions.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages11-27
Number of pages17
Volume3585
StatePublished - Mar 3 1999
EventProceedings of 1999 Nondestructive Evaluation of Aging Materials and Composites III - Newport Beach, CA, USA
Duration: Mar 3 1999Mar 5 1999

Other

OtherProceedings of 1999 Nondestructive Evaluation of Aging Materials and Composites III
CityNewport Beach, CA, USA
Period3/3/993/5/99

Fingerprint

fretting
Wavelet analysis
wavelet analysis
Wavelet transforms
nonuniformity
damage
energy

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Frantziskonis, G. N., Shell, E., Woo, J., Matikas, T. E., & Nicolaou, P. D. (1999). Wavelet analysis of fretting experimental data. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3585, pp. 11-27). Society of Photo-Optical Instrumentation Engineers.

Wavelet analysis of fretting experimental data. / Frantziskonis, George N; Shell, E.; Woo, J.; Matikas, T. E.; Nicolaou, P. D.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3585 Society of Photo-Optical Instrumentation Engineers, 1999. p. 11-27.

Research output: Chapter in Book/Report/Conference proceedingChapter

Frantziskonis, GN, Shell, E, Woo, J, Matikas, TE & Nicolaou, PD 1999, Wavelet analysis of fretting experimental data. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 3585, Society of Photo-Optical Instrumentation Engineers, pp. 11-27, Proceedings of 1999 Nondestructive Evaluation of Aging Materials and Composites III, Newport Beach, CA, USA, 3/3/99.
Frantziskonis GN, Shell E, Woo J, Matikas TE, Nicolaou PD. Wavelet analysis of fretting experimental data. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3585. Society of Photo-Optical Instrumentation Engineers. 1999. p. 11-27
Frantziskonis, George N ; Shell, E. ; Woo, J. ; Matikas, T. E. ; Nicolaou, P. D. / Wavelet analysis of fretting experimental data. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3585 Society of Photo-Optical Instrumentation Engineers, 1999. pp. 11-27
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