Wavelet analysis of fretting experimental data

G. N. Frantziskonis, E. Shell, J. Woo, T. E. Matikas, P. D. Nicolaou

Research output: Contribution to journalConference article

2 Scopus citations

Abstract

Wavelet analysis is applied to the characterization of the fretting damage of materials. Two cases are considered. In the first case, fretted surfaces in a Ti-6Al-4V alloy are quantitatively characterized by analyzing profilometric digital images of fretted surfaces. Through wavelet analysis, dominant length scales are determined as those regions in the scale-space where the energy of the wavelet transform and/or peaks of local concentration dominate. The second use of wavelets deals with the non-uniformity of the contact regions. In particular, wavelet analysis is employed to identify those regions.

Original languageEnglish (US)
Pages (from-to)11-27
Number of pages17
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3585
StatePublished - Mar 3 1999
EventProceedings of 1999 Nondestructive Evaluation of Aging Materials and Composites III - Newport Beach, CA, USA
Duration: Mar 3 1999Mar 5 1999

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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