Wavelet-based multiscaling in self-affine random media

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

Wavelet analysis is used to determine particular properties of self-affine random media, i.e. ones with homogeneous increments. When such media are filtered through introducing upper and lower cutoffs - corresponding to the domain and sample support scales -interesting properties result from wavelet analysis. In particular, we show that the filtered media can be used for transferring information along scales. Furthermore, we show that a wavelet-based approach for determining the underlying Hurst exponent is highly efficient. Examples relating to size and surface effects in materials demonstrate applications of the relevant multiscaling. Finally, we show that the wavelet-based approach and a method based on mode superposition complement each other nicely.

Original languageEnglish (US)
Pages (from-to)403-411
Number of pages9
JournalFractals
Volume8
Issue number4
DOIs
StatePublished - Dec 2000

ASJC Scopus subject areas

  • Modeling and Simulation
  • Geometry and Topology
  • Applied Mathematics

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