X-ray diffraction analysis of lattice strain in metallic superlattice films

N. Nakayama, L. Wu, H. Dohnomae, T. Shinjo, J. Kim, C. M. Falco

Research output: Contribution to journalArticlepeer-review

10 Scopus citations


In-plane lattice spacings of [Au(xÅ)/Ni(xÅ)] and [Pd(xÅ)/Cu(xÅ)] superlattice films with [111]fcc textures and large lattice misfits have been measured by X-ray diffraction. With decrease of superlattice period (Λ = 2x), Au and Pd layers are compressed whereas Ni and Cu layers are expanded. The observed lattice spacings (d220) of the individual layers vary almost linearly depending on 1/Λ. The lattice spacings of two constituent layers become equal in a Au/Ni superlattice with Λ = 8 A ̊ (d220 = 1.371 A ̊) and a Pd/Cu superlattice with Λ = 14 A ̊ (d220 = 1.337 A ̊).

Original languageEnglish (US)
Pages (from-to)71-75
Number of pages5
JournalJournal of Magnetism and Magnetic Materials
Issue number1-3
StatePublished - Sep 1993

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


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