X-ray diffraction analysis of lattice strain in metallic superlattice films

N. Nakayama; L. Wu; H. Dohnomae; T. Shinjo; J. Kim; Charles M Falco

doi:10.1016/0304-8853(93)90548-G

X-ray diffraction analysis of lattice strain in metallic superlattice films

N. Nakayama, L. Wu, H. Dohnomae, T. Shinjo, J. Kim, Charles M Falco

Optical Sciences, College of

Research output: Contribution to journal › Article

10 Citations (Scopus)

Abstract

In-plane lattice spacings of [Au(xÅ)/Ni(xÅ)] and [Pd(xÅ)/Cu(xÅ)] superlattice films with [111]_fcc textures and large lattice misfits have been measured by X-ray diffraction. With decrease of superlattice period (Λ = 2x), Au and Pd layers are compressed whereas Ni and Cu layers are expanded. The observed lattice spacings (d₂₂₀) of the individual layers vary almost linearly depending on 1/Λ. The lattice spacings of two constituent layers become equal in a Au/Ni superlattice with Λ = 8 A ̊ (d₂₂₀ = 1.371 A ̊) and a Pd/Cu superlattice with Λ = 14 A ̊ (d₂₂₀ = 1.337 A ̊).

Original language	English (US)
Pages (from-to)	71-75
Number of pages	5
Journal	Journal of Magnetism and Magnetic Materials
Volume	126
Issue number	1-3
DOIs	https://doi.org/10.1016/0304-8853(93)90548-G
State	Published - 1993

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Metallic films

X ray diffraction analysis

Textures

X ray diffraction

spacing

diffraction

x rays

textures

ASJC Scopus subject areas

Condensed Matter Physics

Cite this

Nakayama, N., Wu, L., Dohnomae, H., Shinjo, T., Kim, J., & Falco, C. M. (1993). X-ray diffraction analysis of lattice strain in metallic superlattice films. Journal of Magnetism and Magnetic Materials, 126(1-3), 71-75. https://doi.org/10.1016/0304-8853(93)90548-G

X-ray diffraction analysis of lattice strain in metallic superlattice films. / Nakayama, N.; Wu, L.; Dohnomae, H.; Shinjo, T.; Kim, J.; Falco, Charles M.

In: Journal of Magnetism and Magnetic Materials, Vol. 126, No. 1-3, 1993, p. 71-75.

Research output: Contribution to journal › Article

Nakayama, N, Wu, L, Dohnomae, H, Shinjo, T, Kim, J & Falco, CM 1993, 'X-ray diffraction analysis of lattice strain in metallic superlattice films', Journal of Magnetism and Magnetic Materials, vol. 126, no. 1-3, pp. 71-75. https://doi.org/10.1016/0304-8853(93)90548-G

Nakayama N, Wu L, Dohnomae H, Shinjo T, Kim J, Falco CM. X-ray diffraction analysis of lattice strain in metallic superlattice films. Journal of Magnetism and Magnetic Materials. 1993;126(1-3):71-75. https://doi.org/10.1016/0304-8853(93)90548-G

Nakayama, N. ; Wu, L. ; Dohnomae, H. ; Shinjo, T. ; Kim, J. ; Falco, Charles M. / X-ray diffraction analysis of lattice strain in metallic superlattice films. In: Journal of Magnetism and Magnetic Materials. 1993 ; Vol. 126, No. 1-3. pp. 71-75.

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abstract = "In-plane lattice spacings of [Au(x{\AA})/Ni(x{\AA})] and [Pd(x{\AA})/Cu(x{\AA})] superlattice films with [111]fcc textures and large lattice misfits have been measured by X-ray diffraction. With decrease of superlattice period (Λ = 2x), Au and Pd layers are compressed whereas Ni and Cu layers are expanded. The observed lattice spacings (d220) of the individual layers vary almost linearly depending on 1/Λ. The lattice spacings of two constituent layers become equal in a Au/Ni superlattice with Λ = 8 A ̊ (d220 = 1.371 A ̊) and a Pd/Cu superlattice with Λ = 14 A ̊ (d220 = 1.337 A ̊).",

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10.1016/0304-8853(93)90548-G