X-ray diffraction measurements of lattice strains in co/pd(00l) superlattice films

Lianjun Wu, Noriaki Nakayama, Brad N. Engel, Teruya Shinjo, Charles M. Falco

Research output: Contribution to journalArticle

5 Scopus citations

Abstract

Lattice spacings in fcc-Co/Pd(00l) superlattice films grown on GaAs(OOl) substrates with a Ag(OOl) buffer layer were measured using a four-circle diffractometer. For samples with Co layers thinner than 9 Å and Pd layers thinner than 12 Å, the observed in-plane (110) lattice spacings were all 2.71 ±0.01 Å, indicating 8.0% lattice expansion of Co layers and 1.5% lattice contraction of Pd layers. The (002) lattice spacings along the growth direction were estimated from a profile fitting method, and they were 1.60 ±0.02 Å for Co layers and 1.98 ±0.02 Å for Pd layers. This means that Co layers are contracted nearly 10%, while Pd layers are expanded 2% along the growth direction of the superlattice films. The estimated large lattice strains are successfully applied to explain the large magnetovolume contribution to the magnetic anisotropy reported previously.

Original languageEnglish (US)
Pages (from-to)4726-4731
Number of pages6
JournalJapanese Journal of Applied Physics
Volume32
Issue number10 R
DOIs
StatePublished - Oct 1993

Keywords

  • Co/Pd(001) superlattice films
  • Four-circle diffractometer
  • Lattice strain
  • Profile fitting
  • X-ray diffraction

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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