X-ray microtomography of ceramic artifacts

J. H. Dunsmuir, Pamela B Vandiver, R. R. Chianelli, H. W. Deckman, J. H. Hardenbergh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In this paper we describe the analysis of ceramic artifacts with a new type of three dimensional x-ray microscopy which can have micron spatial resolution. The x-ray microscopy is based on a microtomographic technique which reconstructs the three dimensional structure of millimeter sized specimens from high resolution digital radiographs of the specimens taken from several hundred different view angles. When the high resolution radiographs are taken with a monoenergetic x-ray beam from a synchrotron source, each volume element (voxel) in the reconstructed data set is quantitatively the x-ray opacity of the equivalent volume in the specimen. Typical reconstructed data sets contain more than 106 voxels and are rendered using computer visualization techniques. Specimens can be nondestructively analyzed so long as they are small enough to fit into the area of the x-ray beam imaged by the detector. We have applied x-ray microtomographic analysis both to a shard specimen taken from a Jun bowl and to a modern ash glaze and show examples of the structure of glazes on these ceramics; interfaces between the glaze and underlying ceramic bodies; and the porosity of ceramic bodies.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium - Proceedings
PublisherMaterials Research Society
Pages73-83
Number of pages11
Volume352
StatePublished - 1995
Externally publishedYes
EventProceedings of the 1994 Conference on Materials Issues in Art and Archaeology IV - Cancun, Mex
Duration: May 16 1994May 21 1994

Other

OtherProceedings of the 1994 Conference on Materials Issues in Art and Archaeology IV
CityCancun, Mex
Period5/16/945/21/94

Fingerprint

X rays
Glazes
Ashes
Microscopic examination
Opacity
Synchrotrons
Visualization
Porosity
Detectors

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Dunsmuir, J. H., Vandiver, P. B., Chianelli, R. R., Deckman, H. W., & Hardenbergh, J. H. (1995). X-ray microtomography of ceramic artifacts. In Materials Research Society Symposium - Proceedings (Vol. 352, pp. 73-83). Materials Research Society.

X-ray microtomography of ceramic artifacts. / Dunsmuir, J. H.; Vandiver, Pamela B; Chianelli, R. R.; Deckman, H. W.; Hardenbergh, J. H.

Materials Research Society Symposium - Proceedings. Vol. 352 Materials Research Society, 1995. p. 73-83.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Dunsmuir, JH, Vandiver, PB, Chianelli, RR, Deckman, HW & Hardenbergh, JH 1995, X-ray microtomography of ceramic artifacts. in Materials Research Society Symposium - Proceedings. vol. 352, Materials Research Society, pp. 73-83, Proceedings of the 1994 Conference on Materials Issues in Art and Archaeology IV, Cancun, Mex, 5/16/94.
Dunsmuir JH, Vandiver PB, Chianelli RR, Deckman HW, Hardenbergh JH. X-ray microtomography of ceramic artifacts. In Materials Research Society Symposium - Proceedings. Vol. 352. Materials Research Society. 1995. p. 73-83
Dunsmuir, J. H. ; Vandiver, Pamela B ; Chianelli, R. R. ; Deckman, H. W. ; Hardenbergh, J. H. / X-ray microtomography of ceramic artifacts. Materials Research Society Symposium - Proceedings. Vol. 352 Materials Research Society, 1995. pp. 73-83
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