X-RAY PHOTOELECTRON/AUGER ELECTRON SPECTROSCOPIC STUDIES OF TIN AND INDIUM METAL FOILS AND OXIDES.

Albert W C Lin, Neal R Armstrong, Theodore Kuwana

Research output: Contribution to journalArticle

244 Citations (Scopus)

Abstract

X-ray photoelectron spectroscopy (XPS or ESCA) and Auger electron spectroscopy (AES) have been applied to the surface analysis of ″standards″ of metal foils and oxides of two elements, tin and indium. For the metal foils, the surface was initially in an oxidized state which could be removed by argon ion sputtering to reveal the pure metal. On the surfaces of the tin and indium foils, the oxygen to metal atomic ratios were close to the expected values for SnO//2 and In//2O//3. These ratios changed with depth profiling until the pure metal was exposed. The energetics and the atomic ratios were also obtained for several powder samples of SnO//2, SnO, and In//2O//3 standards. The problems and approaches to the identification of elemental composition and to quantification of oxygen to metal atomic ratios are discussed.

Original languageEnglish (US)
Pages (from-to)1228-1235
Number of pages8
JournalAnalytical Chemistry
Volume49
Issue number8
StatePublished - Jul 1977
Externally publishedYes

Fingerprint

Indium
Tin
Photoelectrons
Oxides
Metal foil
Metals
X rays
Electrons
X ray photoelectron spectroscopy
Oxygen
Depth profiling
Argon
Surface analysis
Auger electron spectroscopy
Powders
Sputtering
Ions
Chemical analysis

ASJC Scopus subject areas

  • Analytical Chemistry

Cite this

X-RAY PHOTOELECTRON/AUGER ELECTRON SPECTROSCOPIC STUDIES OF TIN AND INDIUM METAL FOILS AND OXIDES. / Lin, Albert W C; Armstrong, Neal R; Kuwana, Theodore.

In: Analytical Chemistry, Vol. 49, No. 8, 07.1977, p. 1228-1235.

Research output: Contribution to journalArticle

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